Performance and mechanism of novel antimony oxo cluster photoresist
With the increasing integration of semiconductor industry,higher requirements are put forward for lithographic materials.In recent years,metal-oxygen oxo clusters(MOCs)photoresists have been widely studied due to the small size and flexible structure design.At present,antimony-based photoresistsare limited to antimony-containing complexes.In this paper,a novel antimony-oxygen oxo cluster photoresist was developed,and the advantages of the self-assembly strategy was demonstrated by comparing the solubility difference between metal-organic assembled Sb4O-1 and self-assembled Sb4O-2.Atomic force microscopy(AFM)confirmed that Sb4O-2 photoresists can form smooth films with a low roughness value(root mean square roughness<0.3 nm).Electron beam lithography(EBL)demonstrated the excellent patterning ability of Sb4O-2 photoresist(line width<50 nm),and theoretical calculations supported a novel self-assembled Sb4O-2"ligand dissociation"mechanism analyzed by X-ray photoelectron spectroscopy(XPS).This work inspired the exploration of additional metal oxygen oxo cluster materials.