Study on the Time Series Effects of the Tropical Ocean and Cold Atmospheric Environment on the Power Transistor
In order to study the time series effects of the tropical ocean and cold atmospheric environment on the power transistors,a method of time series testing in tropical and cold environments was adopted.The experimental samples were placed in a shed chassis to simulate their usage environment,and natural environment testing was carried out.During the testing process,the samples were regularly analyzed for changes in appearance and functional performance.After 5 months cold atmospheric environmental testing and 5 months of tropical ocean environmental testing,the samples showed that the parameters ICBO and ICEO exceeded the tolerance.During the experimental process,the appearance and functional performance changes were analyzed,and the main environmental influencing factors were determined through failure analysis.It found that the reason for the failure of power transistors was local corrosion of the tube shell caused by CI ions,resulting in oxidation products and leakage between pins.The above experimental results can provide technical support for the improvement of its tropical ocean and cold environment adaptability design.
power transistorsnatural environment testingthe time series effectsfailure analysis
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