Storage Life Evaluation of Optical Fiber Connectors Under Temperature Cycle Acceleration Degradation Test
It is difficult to evaluate the storage life of optical fiber connectors under alternating temperature,a life evaluation method under modified Coffin-Manson model is proposed.Firstly,the storage failure mode and mechanism of optical fiber connector are analyzed.Then,the temperature cycle accelerated degradation test of optical fiber connector under multiple accelerated stress levels is carried out,and the power function degradation trajectory model is established based on the insertion loss accelerated degradation data.Then,combined with the failure threshold,the pseudo failure life at different accelerated stress levels is determined.Through the hypothesis test,it is deduced that the pseudo failure life of optical fiber connector at each stress level follows the normal distribution.Finally,the modified Coffin-Manson acceleration model is introduced to extrapolate the storage life of optical fiber connectors.The storage life of an optical fiber connector evaluated by this method under the actual stress level is close to the actual storage life,which verifies the effectiveness and feasibility of the method.
optical fiber connectorstorage lifemodified coffin manson modeltemperature cycling testaccelerated degradation test
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