Life Evaluation Method of Multi-Chip T/R Components Based on Accelerated Life Test
T/R module is an important part of active phased array antenna.With the wide application of multi-chip integration technology in TR module,long-term reliability becomes a crucial issue.Accelerated life test is the most common method to evaluate the long-term reliability of multi-chip T/R module.In this paper,a typical multi-chip T/R module is selected to analyze the whole structure and key parts,and determine the test sensitive parameters.The weak links and test conditions were obtained by junction temperature test.According to the basic principle of the multi-stress evaluation test method,a test platform was built,and the multi-stress accelerated life evaluation test was carried out based on the Weibull model.Three temperature points of 85℃、105℃、125℃were selected respectively in the test.The analysis of test data showed that the variation trend of sample parameters under the three test temperatures was consistent.Therefore,the failure mode and failure mechanism of samples under different test temperatures were the same.Finally,life prediction was carried out by Weibull estimation method,and curve fitting was carried out by Arrhenis equation.Accelerated life curves at different temperatures were obtained,which provided a reference for reliability analysis and evaluation of microwave integrated multi-chip T/R module.
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