Reliability Prediction of Mass Spectrometer Electronic Control System based on Component Stress Method
In the design stage of microwave plasma mass spectrometer control system,the component stress method is an effective method to obtain the reliability index of the design scheme.However,the method of directly summing the component stress method to obtain the total failure rate of the same type of components will lead to the linear increase of the standard deviation of the total failure rate,which will bring uncertainty to the predicted result.In this paper,based on the total failure rate and its standard deviation,an estimation method based on confidence upper limit is adopted to make the predicted results have a higher confidence level.Finally,the reliability prediction of the control system is realized,and an optimization scheme is proposed according to the predicted results.
component stress methodreliability predictionupper confidence limitmass spectrometer control system
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