Design of a 7 1/2 Bits Resolution ADC Based on Improved Multi-Ramp Ⅲ Technology
High-precision test instruments play an important role in environmental testing,and integral AD converters are widely used in high-precision test instruments.Aiming at the problem of low conversion rate of traditional integral AD converters,an improved multi-slope Ⅲ AD converter with higher conversion rate is proposed,and its principle and design idea are introduced in detail.The converter controls the integral ADC together with CPLD using single-chip microcomputer.At the end of integration,the residual voltage of the integrator is measured using the on-chip ADC of the single-chip microcomputer to achieve the purpose of improving the conversion rate.Through theoretical analysis,the AD converter is 836 times faster than the traditional one,and the resolution can reach 31 bits,which can achieve 7.5 bits resolution in±10V DC voltage measurement.
multi-ramp Ⅲ AD conversionhigh precisionAD conversion7 1/2 bits resolution
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