基于改进型多斜Ⅲ技术的7位半AD转换器设计
Design of a 7 1/2 Bits Resolution ADC Based on Improved Multi-Ramp Ⅲ Technology
张航 1李留生 1罗期任 1陈志雄1
作者信息
- 1. 工业和信息化部电子第五研究所,广州 511370
- 折叠
摘要
高精度测试仪器在环境试验中扮演着重要角色,而积分型AD转换器被广泛的应用在高精度测试仪器中.针对传统型积分型AD转换器转换速率较低的问题,提出了一种提高转换速率的改进型多斜Ⅲ AD转换器,详细的介绍了其原理和设计思路.该转换器以单片机与CPLD一同控制积分型ADC,在积分末尾利用单片机片内ADC测量积分器的残留电压,以达到提高转换速率的目的.经理论分析该AD转换器比传统型转换速率快 836 倍,分辨率可达到 31 位,在±10 V直流电压测量中可实现 7 位半分辨率.
Abstract
High-precision test instruments play an important role in environmental testing,and integral AD converters are widely used in high-precision test instruments.Aiming at the problem of low conversion rate of traditional integral AD converters,an improved multi-slope Ⅲ AD converter with higher conversion rate is proposed,and its principle and design idea are introduced in detail.The converter controls the integral ADC together with CPLD using single-chip microcomputer.At the end of integration,the residual voltage of the integrator is measured using the on-chip ADC of the single-chip microcomputer to achieve the purpose of improving the conversion rate.Through theoretical analysis,the AD converter is 836 times faster than the traditional one,and the resolution can reach 31 bits,which can achieve 7.5 bits resolution in±10V DC voltage measurement.
关键词
多斜Ⅲ/A/D/高精度/AD转换器/7位半分辨率Key words
multi-ramp Ⅲ AD conversion/high precision/AD conversion/7 1/2 bits resolution引用本文复制引用
出版年
2024
NETL
NSTL
万方数据