首页|T/R组件过激励试验可靠性与失效机理研究

T/R组件过激励试验可靠性与失效机理研究

Study on Reliability and Failure Mechanism of Over Excitation Test for T/R Module

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T/R组件作为通信系统的核心部件,在运行环境下其接收通道经常面临外界大功率强扰动信号.外界大功率强扰动信号是影响T/R组件可靠性的重要因素,鉴于此本文搭建T/R组件过激励测试试验平台,对T/R组件接收通道进行过激励试验,并借助金相显微镜及聚焦离子束等失效分析技术对试验后T/R组件开展失效分析研究.依据试验结果,确定了组件中接收通道在过激励下的失效部位、失效模式及失效机理,检验了典型T/R组件的抗扰动、耐功率、抗烧毁能力,为T/R组件的耐功率、抗烧毁设计提供借鉴和指导.
T/R module are the core components of communication systems,and the receiver channel in the T/R module often face strong interference signals from the outside environment in operation.Strong external interference signals are an important factor affecting the reliability of T/R module.Therefore,this paper establishes a test platform for over-excitation testing of T/R module and conducts over-excitation tests on T/R module.It also uses metallographic microscopes and focused ion beam(FIB)failure analysis techniques to conduct failure analysis on the T/R module after the test.Based on the test results,the failure locations,failure modes,and failure mechanisms of the receiver channel in the T/R module under over-excitation are determined.The test verifies the anti-interference,power resistance,and burnout resistance of typical T/R module,and provides reference and guidance for the power resistance and burnout resistance design of T/R module.

T/R Moduleover excitation testreliabilityfailure analysis

王振亚、刘文豹

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中国电子科技集团公司第十三研究所,石家庄 050051

T/R组件 过激励试验 可靠性 失效分析

2024

环境技术
广州电器科学研究院有限公司

环境技术

CSTPCD
影响因子:0.995
ISSN:1004-7204
年,卷(期):2024.42(9)