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一种VCO芯片筛选方法的研究

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元器件厂商通常只给出性能指标范围,但同型号芯片之间也存在性能差异.本文描述了针对某产品特性,需进行补充元器件筛选测试再分类使用,设计了不同抽样实验方案,对抽样结果利用统计方法对芯片批次性能分析,并对芯片分类使用效果进行跟踪分析,总结得出了芯片分类和使用方法,从而提升了该产品生产效率.
A study on a Screening Method for VCO Chips
Component manufacturers usually only give a range of performance indicators,but there are differences between different chip performance.This paper describes the need for supplementary component screening tests and then classification and use for a certain product characteristic,designs different sampling schemes,and uses statistical methods to analyze the performance of chip batches and the use effect of chip classification by statistical methods for sampling results,and summarizes the chip classification and use methods,thereby improving the production efficiency of the product.

samplingchip testingcomponent performanceVCO

陈曦

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中国电子科技集团第十研究所,成都 610036

抽样 芯片测试 元器件性能 VCO

2024

环境技术
广州电器科学研究院有限公司

环境技术

CSTPCD
影响因子:0.995
ISSN:1004-7204
年,卷(期):2024.42(12)