Aiming at the failure mechanism and technical problems of life evaluation of long-life electronic products,based on the in-depth analysis of the failure mechanism and failure mode of long-life electronic products,the failure physical model of accelerated life test for electronic products under temperature stress is studied,and the mathematical model for calculating acceleration factor is derived based on the principle of consistency of failure mechanism,and then the equivalent conversion relationship between life under normal working stress and life under accelerated stress is established,which solves the problems of long cycle,low efficiency and high cost of traditional methods for life evaluation of highly reliable electronic products.According to the requirements of life index of electronic products,the life evaluation time in natural environment is obtained by combining the reliability appraisal test method.Based on the equivalent conversion of acceleration factors under the same failure mechanism,a life evaluation scheme of highly reliable electronic products is designed,which makes the life consumption of 12 556 h under normal working temperature of 25℃equivalent to 587 h under accelerated condition of 70℃,greatly improving the efficiency of life evaluation,and providing theoretical basis for the failure mechanism and rapid life evaluation of highly reliable electronic products.
维普
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