Optimization and Application of Inner Cavity Height Testing Method in PIND Test of Components
The test conditions for the Particle Impact Noise Detection(PIND)method are primarily determined by the cavity height of the components.To ensure the accuracy of the cavity height,this paper,based on the application of X-ray imaging technology in semiconductor inspection,studied the mechanism of X-ray penetration imaging and the impact of long-term operation of the X-ray filament on measurement dimensions.By analyzing the proportional relationship between the actual external dimensions of the components and the dimensions marked by X-rays,the traditional cavity height measurement method was optimized.On this basis,a cavity height calculation software was developed,establishing a software platform that does not require X-ray marking or manual calculation.At the same time,the platform can match the test conditions according to the actual cavity height,control the excitation state of the vibration table,and provide a motion that is essentially sinusoidal for the tested components,thereby improving the accuracy and efficiency of the PIND test.With its characteristics of high efficiency,precision,and ease of use,this method will play an increasingly important role in the field of electronic component inspection and testing.
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