首页|Observation and mechanism of non-uniform distribution of tin nuclei in preparing vapor diffusion coated Nb3Sn thin film for SRF applications

Observation and mechanism of non-uniform distribution of tin nuclei in preparing vapor diffusion coated Nb3Sn thin film for SRF applications

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Growth of high-quality Nb3Sn thin films for superconducting radiofrequency(SRF)applications using the vapor diffusion method requires a uniform distribution of tin nuclei on the niobium(Nb)surface.This study examines the mechanism underlying the observed non-uniform distribution of tin nuclei with tin chloride SnCl2.Electron backscatter diffraction(EBSD)analysis was used to examine the correlation between the nucleation behavior and orientation of niobium grains in the substrate.The findings of the density functional theory(DFT)simulation are in good agreement with the experimental results,showing that the non-uniform distribution of tin nuclei is the result of the adsorption energy of SnCl2 molecules by varied niobium grain orientations.Further analysis indicated that the surface roughness and grain size of niobium also played significant roles in the nucleation behavior.This study provides valuable insights into enhancing the surface pretreatment of niobium substrates during the growth of Nb3Sn thin films using the vapor diffusion method.

NucleationTin chlorideNon-uniform distributionVapor diffusionCrystal orientationAdsorption energy

Shuai Wu、Yang Ye、Zi-Qin Yang、Yuan He、Jian-Peng Li、Guang-Ze Jiang、Lu Li、Shi-Chun Huang、An-Dong Wu、Hang-Xu Li、Shao-Hua Lu、Tao Liu、Feng Qiu、Cang-Long Wang、Ji-Zheng Duan、Teng Tan、Zhi-Jun Wang、Sheng-Hu Zhang、Hong-Wei Zhao、Wen-Long Zhan

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Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China

School of Nuclear Science and Technology,University of Chinese Academy of Sciences,Beijing 100049,China

Advanced Energy Science and Technology Guangdong Laboratory,Huizhou 516007,China

School of Microelectronics,Dalian University of Technology,Dalian 116000,China

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2025

核技术(英文版)
中国科学院上海应用物理研究所,中国核学会

核技术(英文版)

影响因子:0.667
ISSN:1001-8042
年,卷(期):2025.36(1)