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Reliability modelling and assessment of CMOS image sensor under radiation environment

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The Complementary Metal-Oxide Semiconductor(CMOS)image sensor is a critical component with the function of providing accurate positioning in many space application systems.Under long-time operation in space environments,there are radiation related degradation and var-ious uncertainties affecting the positioning accuracy of CMOS image sensors,which further leads to a reliability reduction of CMOS image sensors.Obviously,the reliability of CMOS image sensors is related to their specified function,degradation,and uncertainties;however,current research has not fully described this relationship.In this paper,a comprehensive approach to reliability modelling of CMOS image sensors is proposed based on the reliability science principles.Firstly,the perfor-mance margin modelling of centroid positioning accuracy is conducted.Then,the degradation model of CMOS image sensors is derived considering the dark current increase induced by the total ionizing dose effects.Finally,various uncertainties are analyzed and quantified,and the measure-ment equation of reliability is proposed.A case study of a CMOS image sensor is conducted to apply the proposed method,and the sensitivity analysis can provide suggestions for design and use of CMOS image sensors to ensure reliability.A simulation study is conducted to present the advantages of the proposed comprehensive approach.

Complementary metal-oxide semiconductor image sensorDegradationReliabilityReliability science principlesTotal ionizing dose effectsUncertainty analysis

Zhao TAO、Wenbin CHEN、Xiaoyang LI、Rui KANG

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School of Reliability and Systems Engineering,Beihang University,Beijing 100191,China

Science and Technology on Reliability and Environmental Engineering Laboratory,Beijing 100191,China

National Natural Science Foundation of ChinaScience Challenge Project,ChinaNational Natural Science Foundation of ChinaFundamental Research Funds for Central Universities,China

51775020TZ201800762073009YWF-19-BJ-J-515

2024

10.1016/j.cja.2024.05.008

中国航空学报(英文版)
中国航空学会

中国航空学报(英文版)

CSTPCDEI
影响因子：0.847
ISSN：1000-9361
年,卷(期)：2024.37(9)