Design of general board-level automatic test system based on cloud-edge collaboration
Aiming at the current digital circuit automatic test field,the general board level automatic test system is designed,and the design,development and test verification of the system scheme are completed.In order to solve the problems of the general board-level automatic test system,such as large amount of test data,insufficient local storage capacity,unable to automatically match test vectors with the tested targets,and unable to carry out batch fast testing,the cloud-edge collaborative architecture is used,to design a general board-level automatic test system,which avoids a large amount of data transmission and data centralized processing.It enables cloud computing resources to focus on solving key data processing tasks.To improve the versatility of the board-level test platform,make the platform suitable for different interface circuit boards,and at the same time have high-speed network data processing capabilities,the system selects Advanced RISC machines and Filed programmable gate array(ARM+FPGA)heterogeneous computing platform as the edge device.To improve the test efficiency of the system,the modular design idea is adopted,and the multi-bus distributed structure is designed for the system hardware test platform.The system uses Fan-out-oriented(FAN)algorithm to generate test vectors and designs a user interface based on Brower/Server(B/S)architecture.Users can perform test operations through a browser,complete automatic fault testing at board level,and automatically generate fault diagnosis reports.The experimental results show that the universal board-level automatic test system can automatically identify the target board,automatically match the test vector,automatically test,and generate the test report.The general board-level automatic test system based on cloud-edge collaboration improves the test efficiency,meets the needs of batch testing of digital circuit boards before they go out of the factory,and has practical application value.
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