首页|Au-NPs对氧化铌忆阻器界面修饰的影响

Au-NPs对氧化铌忆阻器界面修饰的影响

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在阻变器件中,通过在氧化铌薄膜和底电极之间旋涂一层金纳米颗粒(Au-NPs)作为界面修饰层,可以明显降低氧化铌忆阻器的阈值电压,提高阈值电压分布的集中性.通过扫描电子显微镜发现,旋涂在底电极上面的Au-NPs分布较为均匀,有利于器件在Au-NPs等固定位置形成导电细丝,从而降低了导电细丝随机形成的可能性.I-V循环测试证实了 Au-NPs的引入明显增强了空间电荷限制电流的输运特性,表明有利于固定导电细丝的生长,提升器件稳定性.
Effect of Au-NPs on the Interfacial Modi-fication of Niobium Oxide Memrist-ors
In the resistive-variable device,by spin-coating a layer of gold nanopartic-les(Au-NPs)be tween the niobium oxide film and the bottom electrode as an interfacial modification layer,the threshold volt age of the niobium oxide memristor can be significant-ly reduced,and the centralisation of the distribution of the threshold voltage can be impr-oved.Through scanning electron microscopy,it was found that the Au-NPs spin-coated on top of the bottom electrode had a more uniform distribution,which was conducive to the for mation of conductive filaments in the device at fixed positions such as Au-NPs,thus r-educing the possibility of the random formation of conductive filaments.The I-V cycling t-est confirmed that the introduction of the Au-NPs significantly enhanced the transport cha-racteristics of the space-charge-limited currents,which was shown to be conducive to the growth of the fixed conductive filaments,and enhance the device stability.

niobium oxide filmsinterfacial modificationgold nanoparticles

王志、陈喆

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武汉工程大学材料科学与工程学院,湖北武汉

氧化铌薄膜 界面修饰 金纳米颗粒

2024

科学技术创新
黑龙江省科普事业中心

科学技术创新

影响因子:0.842
ISSN:1673-1328
年,卷(期):2024.(17)