The Influence and Mechanism of Grain Size on the Reliability of Multilayer Ceramic Capacitors
The effects of grain size on the performance of BaTiO3-based thin-layer Multilayer Ceramic Capacitors (MLCC) was investigated.A comprehensive and systematic study was conducted using Raman spectroscopy,tem-perature coefficient of capacitance (TCC) curves,bias characteristics,volt-ampere (Ⅰ-Ⅴ) characteristic curves,variable temperature impedance spectroscopy,Weibull distribution of breakdown voltage (BDV) ,and highly accel-erated life testing (HALT) to assess the effects of grain size on the electrical properties and reliability of MLCCs.It was found that grain size plays a significant role in the bias stability and reliability of MLCCs.Fine-grained ML-CCs,due to their higher grain boundary density,exhibit increased grain boundary and interface activation energy,as well as enhanced Schottky barriers.These factors contribute to a notable improvement in the breakdown strength and resistance to aging,thereby enhancing the overall reliability of the devices.The findings provide valuable theo-retical insights and technical guidance for improving the performance of domestically produced MLCCs.
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