首页|半导体器件测试系统中的校准策略分析

半导体器件测试系统中的校准策略分析

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阐述电子器件测试中的准确度与稳定性、高效性与自动化的问题及原因.针对测试准确度与稳定性问题,提出仪器校准和标定策略优化、噪声抑制和信号增强方法引入的解决措施.针对高效性与自动化问题,提出并行测试技术应用、自动化脚本编写和远程控制策略优化的解决措施.
Analysis of Calibration Strategies in Semiconductor Device Testing Systems
This paper expounds the issues and reasons of accuracy and stability,efficiency and automation in electronic device testing.It proposes solutions for instrument calibration and calibration strategy optimization,noise suppression,and signal enhancement methods to address the issues of testing accuracy and stability.It proposes solutions for efficiency and automation issues,including the application of parallel testing technology,automated script writing,and optimization of remote control strategies.

integrated circuitelectronic devicestesting technologytesting accuracy

周智芳

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贵州省机械电子产品质量检验检测院,贵州 550014

集成电路 电子器件 测试技术 测试准确度

2024

集成电路应用
上海贝岭股份有限公司

集成电路应用

影响因子:0.132
ISSN:1674-2583
年,卷(期):2024.41(3)
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