首页|HARP-SiCoNi工艺在量产环境下提升高台阶比浅沟道隔离填充能力的研究

HARP-SiCoNi工艺在量产环境下提升高台阶比浅沟道隔离填充能力的研究

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阐述基于量产环境中"高台阶比"的"非标准V型"STI结构,使用传统的HARP和SiCoNi组合工艺研究该结构Void Free的填充方案,并测试HARP预沉积厚度和SiCoNi刻蚀量的工艺窗口,实现量产环境下"高台阶比"的"非标准V型"沟槽Void Free填充.
Study on the Improvement of the HARP-SiCoNi Process in the Mass Production Environment to Improve the Filling Capacity of High Step Ratio Compared to Shallow Trench Isolation
This paper describes the"non-standard V-type"STI structure with"high step ratio"in mass production environment,the void free filling scheme of the structure using the traditional combination of HARP and SiCoNi process,and the process window of HARP pre-deposition thickness and SiCoNi etching amount in testing,so as to release the void free filling of"non-standard V-shaped"trench with"high step ratio"in mass production environment.

integrated circuits manufacturingSTI gap fillHARPSiCoNiVoid

倪立华、丁亚钦、李宗旭

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上海华虹宏力半导体制造有限公司,上海 201203

集成电路制造 STI填充 HARP SiCoNi Void

2024

集成电路应用
上海贝岭股份有限公司

集成电路应用

影响因子:0.132
ISSN:1674-2583
年,卷(期):2024.41(4)