集成电路应用2024,Vol.41Issue(6) :50-51.DOI:10.19339/j.issn.1674-2583.2024.06.022

电子元器件可靠性测试与评估分析

Analysis of Reliability Testing and Evaluation of Electronic Devices

赵臣龙
集成电路应用2024,Vol.41Issue(6) :50-51.DOI:10.19339/j.issn.1674-2583.2024.06.022

电子元器件可靠性测试与评估分析

Analysis of Reliability Testing and Evaluation of Electronic Devices

赵臣龙1
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作者信息

  • 1. 俐玛光电科技(北京)有限公司,北京 100176
  • 折叠

摘要

阐述电子元器件可靠性测试与评估方法,包括介绍电子元器件在极端环境下运行、振动与冲击、寿命、电气性能、质量控制的测试技术,以及电子元器件的寿命、加速寿命、加速退化的试验评估.

Abstract

This paper describes the reliability testing and evaluation methods for electronic devices,including the introduction of testing techniques for electronic components operating in extreme environments,vibration and impact,lifespan,electrical performance,and quality control,as well as experimental evaluations of the lifespan,accelerated lifespan,and accelerated degradation of electronic devices.

关键词

电子元器件/可靠性测试与评估/寿命试验

Key words

electronic devices/reliability testing and evaluation/life testing

引用本文复制引用

出版年

2024
集成电路应用
上海贝岭股份有限公司

集成电路应用

影响因子:0.132
ISSN:1674-2583
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