首页|电子器件老化测试中的新技术应用

电子器件老化测试中的新技术应用

扫码查看
阐述电子元器件老化测试是提高产品可靠性和确保产品质量的关键技术.介绍当前老化测试的新技术,包括加速寿命试验(ALT)、重复性测试(RT)和3D打印夹具.ALT通过加速产品老化过程来评估产品可靠性和寿命,RT测试评估产品重复使用期间的性能,3D打印能够快速灵活定制夹具以进行精确测试.
Application of Innovative Technologies in Electronic Burn-in Testing
This paper describes that electronic component burn-in testis a key technology for improving product reliability and ensuring product quality.This article introduces new burn-in technologies,such as Accelerated Life Testing(ALT),Repeatability Testing(RT),and 3D printed test fixtures.ALT is a testing method that evaluates product reliability by accelerating the aging process.RT assesses performance during repeated use.3D printing allows for the rapid and flexible customization of burn-in sockets for precise testing.

electronic devicesburn-in testaccelerated life testingrepeatability testing3D printed test fixtures

张大为

展开 >

中国电子科技集团公司第十四研究所,江苏 210039

电子器件 老化测试 加速寿命试验 重复性测试 3D打印夹具

2024

集成电路应用
上海贝岭股份有限公司

集成电路应用

影响因子:0.132
ISSN:1674-2583
年,卷(期):2024.41(7)