Analysis of Acoustic Scanning Inspection of Multilayer Ceramic Capacitors
This paper describes the feasibility of acoustic scanning inspection(SAM)for detecting internal defects in ceramic capacitors,and explores the research purpose and value of acoustic scanning inspection for multi-layer ceramic capacitors.It introduces the detection methods for defects such as voids,delamination,and cracks inside multilayer ceramic capacitors,and verifies the results.
万方数据
维普
