Analysis of Reliability Testing and Failure for Integrated Circuit Devices
This paper describes that reliability testing and failure analysis can ensure the quality of semiconductor products and extend their service life.It explores the reliability testing of semiconductor integrated circuit devices and their application in different stages of the product lifecycle through burn-in identification and screening of early faults,prediction of failure rates during accidental failure periods,and comprehensive analysis of wear and tear failure periods.
integrated circuitssemiconductor devicesburn-in and testingreliability testingreliability functioncumulative failure probability
万方数据
维普
