This paper describes that reliability testing and failure analysis can ensure the quality of semiconductor products and extend their service life.It explores the reliability testing of semiconductor integrated circuit devices and their application in different stages of the product lifecycle through burn-in identification and screening of early faults,prediction of failure rates during accidental failure periods,and comprehensive analysis of wear and tear failure periods.
关键词
集成电路/半导体器件/老化测试/可靠性测试/可靠度函数/累积失效概率
Key words
integrated circuits/semiconductor devices/burn-in and testing/reliability testing/reliability function/cumulative failure probability
维普
万方数据