首页|非干涉无标记三维折射率显微成像的研究进展

非干涉无标记三维折射率显微成像的研究进展

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光学衍射层析成像以折射率为内源性染剂,非侵入式地获取生物样本的三维结构信息,并有希望实现对活体样本(如活细胞等)的长时间动态观测,在生物医学和生命科学领域具有重要的意义。然而,光学衍射层析成像依赖于弱散射近似和干涉测量,前者极大地限制此项技术在集群细胞和组织等厚样本上的观测表现,后者则会显著地增加成像系统的复杂度。针对上述问题,研究人员开发了一类基于非干涉强度测量原理的衍射层析成像技术。首先,对非干涉强度衍射层析成像进行基本描述,包括其成像系统、成像指标和重建问题等;接下来从非干涉相位恢复、三维光学传递函数、多层递归正向传播模型和神经网络4条技术路线介绍非干涉强度衍射层析成像的研究成果和最新进展,并对上述方法进行对比;最后讨论当前面临的问题和挑战以及未来的研究方向。
Research Progress on Non-Interferometric Label-Free Three-Dimensional Refractive Index Microscopy
Optical diffraction tomography(ODT)uses refractive index(RI)as endogenous dyes to non-invasively obtain three-dimensional(3D)structural information of biological samples,and is promising to achieve long-term dynamic observation for living samples(such as live cells,etc.),which is of great significance in the fields of biomedical and life sciences.However,ODT relies on weak scattering approximation and interferometric measurement.The former greatly limits the observation performance of this technology on thick samples such as clustered cells and tissues,and the latter significantly increases the complexity of the imaging system.To address these issues,researchers have developed a class of diffraction tomography based on the principle of non-interferometric intensity measurement.First,a basic description of non-interferometric intensity diffraction tomography(IDT)is provided,including its imaging system,imaging metrics,and reconstruction problem;Then,we introduce the research results and latest progresses of non-interferometric IDT from four technical routes:non-interferometric phase retrieval,3D optical transfer function,multi-layer forward propagation model,and neural network,and compare the above methods;Finally,current problems and challenges as well as future research directions are discussed.

diffraction tomographynon-interferometric intensity measurementforward physical imaging model3D refractive index reconstruction

仝展、任雪松、张子晗、苗玉彬、孟国香

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上海交通大学机械与动力工程学院,上海 200240

衍射层析成像 非干涉强度测量 正向物理成像模型 三维折射率重建

国家自然科学基金国家自然科学基金

51975361U1931137

2024

激光与光电子学进展
中国科学院上海光学精密机械研究所

激光与光电子学进展

CSTPCD北大核心
影响因子:1.153
ISSN:1006-4125
年,卷(期):2024.61(4)
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