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针对曲面光学元件的五轴表面形貌测量系统结构参数标定

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针对曲面光学元件的表面形貌测量,将自研扫描白光干涉测头集成到Moore五轴运动平台上构建了一套五轴白光干涉测量系统.为了实现自动化测量,研究了该系统的运动学模型并解得逆运动学方程组.对于逆运动学方程组中的未知参数,提出一种使用已知表达式的高精度非球面标定件的标定方法.最后进行了标定精度验证实验,结果表明,自动调焦调平后实际对焦点坐标与理论对焦点坐标误差不超过±3 μm,满足测头的测量需求,能够对曲面光学元件表面形貌进行自动化测量.
Calibration of Structural Parameters of Five-Axis Surface Topography Measurement System for Curved Optics
A five-axis white-light interference-measurement system is constructed by integrating a self-developed coherence scanning interferometric probe into a Moore five-axis motion platform for the surface-morphology measurement of curved optical components.To achieve automated measurement,the kinematic model of the system is investigated and the inverse kinematic equations are solved.A calibration method using high-precision aspherical calibration components with known expressions is proposed for unknown parameters in the inverse kinematics equations.Finally,an experiment to verify the calibration accuracy of the proposed system is conducted,and the results show that after automatic focusing and leveling,the error between the actual and theoretical focal coordinates remains less than±3 μm.The measurement requirements of the probe is satisfied,and the proposed system can automatically measure the surface morphology of curved optical components.

coherence scanning interferometrysurface topography measurementfive-axis white-light interferometric systemkinematic modelparameter calibration

杨俊、沈毅君、刘嘉宇、温荣贤、任明俊、苏榕

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上海交通大学机械与动力工程学院,上海 200240

中国科学院上海光学精密机械研究所,上海 201800

扫描白光干涉技术 表面形貌测量 五轴白光干涉测量系统 运动学模型 参数标定

2024

激光与光电子学进展
中国科学院上海光学精密机械研究所

激光与光电子学进展

CSTPCD北大核心
影响因子:1.153
ISSN:1006-4125
年,卷(期):2024.61(17)