半导体激光器抗辐照性能无损检测系统的研制
Development of a non-destructive testing system for the irradiation resistance of semiconductor lasers
王双争 1曹军胜 2于松群 2高志坚2
作者信息
- 1. 中国科学院长春光学精密机械与物理研究所,长春 130033;中国科学技术大学,合肥 230026
- 2. 中国科学院长春光学精密机械与物理研究所,长春 130033
- 折叠
摘要
半导体激光器的电导数和低频电噪声参数可以反映器件的内部缺陷,与器件抗辐照性能具有相关性.介绍了基于电导数技术和低频电噪声技术设计的半导体激光器抗辐照性能检测系统,能够测量并提取激光器电导数及低频电噪声参数.通过微小剂量辐照前后的敏感参数对半导体激光器进行抗辐照性能评价,具有灵敏、无损等优势.
Abstract
The electrical derivative and low-frequency electrical noise parameters of semiconductor lasers can re-flect the internal defects of devices and are related to the radiation resistance performance of devices.This thesis intro-duces a irradiation resistance performance testing system for semiconductor lasers designed based on the electrical de-rivative and low-frequency electrical noise techniques,which can measure and extract the electrical conductivity and low-frequency electrical noise parameters of lasers.By evaluating the sensitive parameters of semiconductor lasers be-fore and after exposure to small doses of radiation,the irradiation resistance performance can be evaluated with the ad-vantages of sensitivity and non-destructive.
关键词
半导体激光器/电导数/低频电噪声/抗辐照性能/无损检测Key words
semiconductor laser/electrical derivative/low-frequency electrical noise/irradiation resistance/non-destructive test引用本文复制引用
出版年
2024
NETL
NSTL
万方数据