During the certification of crystalline silicon cells,current-voltage characteristic parameter is an impor-tant parameter,which has great influence on photoelectric conversion efficiency and filling factor.At present,the pa-rameter test mainly includes derivation method,two-step method and wire method,and the short circuit current ob-tained is different.In this paper,different testing methods are used to explore the causes of short-circuit current in-fluence of crystalline silicon cells.The experiment shows that the short-circuit current is affected by the covering of probe bank and silk wire,probe bank type and shadowless probe,and the shielding of battery.The experimental and analytical results can provide theoretical basis and reference for different testing methods in testing institutions or la-boratories.
关键词
晶硅电池/测试方法/短路电流
Key words
silicon solar cell/test method/short circuit current
维普
万方数据