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计算芯片(MCU)测试台架方案设计与试验验证

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目的:为了解决计算芯片(MCU)应用前期,需针对每一款分别设计对应的开发板、进行外设的功能驱动测试、不具备通用性、制作PCB板周期长等问题.方法:设计一种标准模块化测试台架,并对通讯和外设进行实验验证.结论:该台架整体功满足设计要求,适应于所有相同封装的MCU,可为其测试提供一种可行方案.
Design and Verification of Computing Chip(MCU)Test Bench
Objective:In order to solve the early application stage of computing chip(MCU),it is necessary to de-sign corresponding development board for each,carry out functional driving test of peripheral devices,lack of univer-sality,and long production cycle of PCB board.Methods:A standard modular test bench was designed and the com-munication and peripherals were verified by experiments.Conclusion:The whole function of the frame meets the de-sign requirements and is suitable for all MCUS with the same package,which can provide a feasible scheme for its testing.

domestic substitutioncomputing chip(MCU)minimum system boardfunctional baseboard

刘廷娇、葛俊良、陈磊、邵旭东、沙暄晨、梁艳艳

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上汽通用五菱汽车股份有限公司

国产替代 计算芯片(MCU) 最小系统板 功能底板

2024

计量与测试技术
成都市计量监督检定测试所

计量与测试技术

影响因子:0.175
ISSN:1004-6941
年,卷(期):2024.50(9)