The work aims to solve the problem that the Arrhenius model cannot estimate the humidity stress sensitive prod-ucts and the Peck model has a long test time.Considering the combined effect of temperature stress and humidity stress on the storage life of the product,under the assumption of constant activation energy of the product,the estimation of the activation energy of the product by Arrhenius model and the estimation of the humidity stress parameters by Peck model were combined to establish a Arrhenius&Peck segmented nonlinear accelerated life estimation model.Based on this model,the life estimation equations of the products were obtained under the double-stress constant-addition test conditions.Taking the constant stress ac-celerated storage test of electronic products on the bomb as an example for simulation and analysis,the estimation of the product life was obtained and compared with the actual life of the product,and the life error and failure rate error of the Arrhenius&Peck model were controlled within 5%,which was more accurate than the Arrhenius model and the Peck model.The constructed Ar-rhenius&Peck segmented nonlinear accelerated life model can make full use of the test data under the temperature and humidity conditions,and has a better application effect on the life estimation of temperature and humidity sensitive products,which pro-vides an optional method for the life estimation of temperature and humidity sensitive products of missiles.
accelerated storageArrhenius modelPeck modelconstant-stress accelerated life testslife predictionacceler-ated life test
NETL
NSTL
维普
万方数据
