The work aims to propose a storage life evaluation and model accuracy verification method based on the Wiener process according to the performance degradation data of the MEMS gyroscope obtained in the step-stress acceleration test.Firstly,temperature was determined as the main environmental factor affecting the performance degradation of MEMS gyro-scopes during storage,and the performance degradation data were obtained by a step-stress acceleration test.Secondly,the evo-lution law of each performance parameter was analyzed,and the scaling factor was determined as the characteristic performance parameter.Finally,the linear drift Wiener process was used to establish a model for the degradation trajectory of the scaling factor,and the storage life at actual natural condition was evaluated.The model accuracy was validated by the leave-one-out method,and the minimum accuracy of the model was 86.44％.According to the established model,when the reliability level was 0.95,the storage life in the actual natural environment(25 ℃)was 50.02 years.The accuracy of the performance degrada-tion model based on the Wiener process was above 85％,so the model is applicable to the performance degradation prediction and storage life evaluation of MEMS gyroscopes under specified storage conditions.
MEMS gyroscopestep-stress degradationscaling factorWiener processstorage life evaluationleave-one-out cross-validation
维普
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