The work aims to propose a reliability analysis method of the missile-borne electronic component based on the storage profile,in order to improve the accuracy of the storage reliability prediction of the electronic components.Based on the analysis of the storage profile and environmental conditions,the missile-borne electronic component was regarded as a phase mission system.Bayesian analysis was introduced,and the reliability model of the electronic component during the storage life cycle was constructed based on the cumulative damage model according to the different correlation and failure rate of each stage.Compared with the reliability prediction under single environmental condition such as cave storage and combat readiness duty,the reliability prediction results in the comprehensive environment based on storage profile were more accurate,and the advantage became more pronounced as the storage time increased.Based on the actual storage profile,the prediction results are more in line with the application practice of missile-borne electronic components,and an effective method for the reliability analysis of other missile-borne components is provided.
reliabilitymissile-borne electronic componentstorage profilephase mission systemBayesian analysiscu-mulative exposure model
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