SRAM-PUF Key Extraction Method and Performance Analysis Based on RS and BCH Codes
The Physical Unclonable Function(PUF)is a unique and nonreplicable physical fingerprint formed by random deviations during chip manufacturing that can be used to identify individual chips.However,PUF chips may fail in authentication applications owing to environmental changes,which affect their output.This paper introduces a key extraction method for fuzzy extractors.By adding Reed-Solomon(RS)hard decoding to a Static Random Access Memory(SRAM)-PUF chip and a BCH soft decoding module to the authentication system,changes in the PUF within a certain range are corrected to ensure authentication.The performance of the SRAM-PUF circuit at three temperatures is analyzed experimentally.The results show that the PUF point distribution of the SRAM-PUF circuit exhibits good balance,with the reliability approaching 100%at room temperature,98.84%-100%at low temperature,and 97.77%-99%at high temperature.Certification is passed when the error-correction ability of the RS and BCH codes exceeds that of the PUF.
Physical Unclonable Function(PUF)Static Random Access Memory(SRAM)fuzzy extractorReed-Solomon(RS)codeBCH code
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