A triple-node-upset self-recovery latch using C-element
With the persistent reduction of process size in integrated circuits,latches are also more and more vulnerable to the influence of triple-node-upset caused by particles radiation.Aiming at this problem,a triple-node-upset tolerance and self-recovery MKEEP latch based on C-element with low power consumption,low delay and high robustness is proposed.Simulation experiments and PVT fluc-tuation experiments show that,compared with other latches with triple-node-upset tolerance or self-recovery capability,the proposed latch has lower power consumption,low delay and area overhead.At the same time,this latch is less sensitive to process,voltage and temperature,and has obvious advan-tages than referenced latches.
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维普
