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A Mixed-Mode BIST Scheme Based on Folding Compression

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In this paper a new scheme for mixed mode scan-based BIST is presented with complete fault coverage, and some new concepts of folding set and computing are introduced.This scheme applies single feedback polynomial of LFSR for generating pseudo-random patterns, as well as for compressing and extending seeds of folding sets and an LFSR, where we encode seed of folding set as an initial seed of LFSR. Moreover these new techniques are 100%compatible with scan design. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs.

BISTrandom pattern testingLFSRfolding setencoding seed

梁华国、Sybille Hellebrand、Hans-Joachim Wunderlich

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Department of Computer and Information, Hefei University of Technology, Hefei 230009. P.R. China

Institute of Applied Computer Science, University of Innsbruck, Austria

Institute of Computer Science, University of Stuttgart, Germany

DFG grant Wu 245/1-3

2002

计算机科学技术学报(英文版)
中国计算机学会

计算机科学技术学报(英文版)

CSTPCDCSCDSCIEI
影响因子：0.432
ISSN：1000-9000
年,卷(期)：2002.17(2)
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