首页|Si基SiC薄膜物理制备工艺研究进展

Si基SiC薄膜物理制备工艺研究进展

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随着微纳电子器件集成化程度不断提高,用Si基SiC薄膜取代SiC体单晶引起了人们极大的兴趣,这种方法不仅有利于降低生产成本,还能与Si基大规模集成电路兼容.文章综述了磁控溅射、分子束外延、离子束溅射、离子注入4种物理制备Si基SiC薄膜主要工艺的研究进展,简单阐述了各种工艺对薄膜性能的影响,对各种工艺的优缺点和存在的问题进行了评述,同时指明了 Si基SiC薄膜领域未来的发展方向.
Advances in physical preparation process of SiC thin films on Si substrates
With the continuous improvement of the integration degree of micro/nano electronic de-vices,the replacement of SiC bulk single crystal with Si based SiC films is not only conducive to reduc-ing the production cost,but also compatible with Si based large-scale integrated circuits.Therefore,the preparation of SiC thin films on Si substrates has aroused great interest.In this review,the re-search progress of four main physical preparation processes of Si based SiC thin films,including mag-netron sputtering,molecular beam epitaxy,ion beam sputtering and ion implantation,is reviewed.The effects of various processes on the properties of thin films are briefly described.Further,the ad-vantages,disadvantages and existing problems of various processes are reviewed,and the future devel-opment direction of Si-based SiC thin films is also pointed out.

SiC thin filmsmagnetron sputteringmolecular beam epitaxyion beam sputteringion implantation

苏江滨、朱秀梅、季雪梅、祁昊、潘鹏、何祖明

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常州大学微电子与控制工程学院,江苏常州 213164

SiC薄膜 磁控溅射 分子束外延 离子束溅射 离子注入

江苏省自然科学基金江苏省研究生科研创新计划江苏省研究生科研创新计划

BK20191453KYCX21_2819KYCX21_2825

2024

常州大学学报(自然科学版)
常州大学

常州大学学报(自然科学版)

影响因子:0.459
ISSN:2095-0411
年,卷(期):2024.36(1)
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