Research on state recognition of device conditions in small-sample scenarios based on deep learning
Since it is difficult to acquire a large amount of data on the annotated device conditions in industrial production,in this article a model is set up for state recognition of device conditions based on deep learning in small-sample scenarios.First-ly,noise in the one-dimensional vibration signals is removed by means of discrete wavelet transformation.These signals are then transformed into the two-dimensional images with the help of Gramian Angular Field(GAF)and processed in grayscale to simplify the matrix and improve the efficiency of deep learning in computation.Secondly,a model of deep learning is introduced.By means of the Siamese architecture,the deep residual structure as a sub-network is subject to improvement through the SimAM self-attention mechanism,which is referred to as SRes-SimAM205.Thirdly,in order to improve both the speed and the accuracy in identifying the optimal value for higher precision,the OneCycleLR function is used to adjust the learning rate in a self-adaptive manner.Finally,in order to validate this method,a gear dataset provided by Central South University is used to conduct the case analysis.The results demonstrate that this method can better extract features and achieve the recognition accuracy of 99.9%,with excellent generalization and adaptability.
state recognitiondeep learningsiamese architectureresidual structureattention mechanism