LED Chip Defect Sorting System Based on Feature Extraction and SVM
Aiming at the problems of low efficiency,slow speed,fatigue,and subjective influence of manual visual inspection of defects in the industrial production of LED chips,this paper studies and designs a set of rapid detection system for LED chip de-fects,and propose an LED chip defect recognition algorithm based on multi-angle and multi-direction fast convolution,regional statistical feature quantity,and support vector machine classification.Based on QT and Opencv,a rapid detection and classifica-tion system for LED chip defects was developed,and the hardware platform for the LED chip detection system was built to realize real-time online defect recognition and automatic sorting of LED chips.Based on the developed LED chip defect sorting system prototype,the LEDchip was tested for defect sorting.