Abstract
Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromag-netic materials and devices.Despite the widespread use of high-energy electrons for atomic-scale imag-ing,they have low sensitivity to spin textures.Typically,the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential.Here,we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography,paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.
基金项目
National Natural Science Foundation of China(52388201)
National Natural Science Foundation of China(51525102)
NETL
NSTL
万方数据