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Antiferromagnetic imaging via ptychographic phase retrieval

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Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromag-netic materials and devices.Despite the widespread use of high-energy electrons for atomic-scale imag-ing,they have low sensitivity to spin textures.Typically,the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential.Here,we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography,paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.

Antiferromagnetic imagingMagnetic latticePtychographyElectron microscopy

Jizhe Cui、Haozhi Sha、Wenfeng Yang、Rong Yu

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School of Materials Science and Engineering,Tsinghua University,Beijing 100084,China

MOE Key Laboratory of Advanced Materials,Tsinghua University,Beijing 100084,China

State Key Laboratory of New Ceramics and Fine Processing,Tsinghua University,Beijing 100084,China

National Natural Science Foundation of ChinaNational Natural Science Foundation of China

5238820151525102

2024

科学通报(英文版)
中国科学院

科学通报(英文版)

CSTPCD
ISSN:1001-6538
年,卷(期):2024.69(4)
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