首页|Mapping the electric field of high-definition transcranial electrical stimulation across the lifespan
Mapping the electric field of high-definition transcranial electrical stimulation across the lifespan
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Mapping the electric field of high-definition transcranial electrical stimulation across the lifespan
Transcranial electrical stimulation(tES)is a non-invasive technique widely used in modulating brain activity and behavior,but its effects differ across individuals and are influenced by head anatomy.In this study,we investigated how the electric field(EF)generated by high-definition tES varies across the lifes-pan among different demographic groups and its relationship with neural responses measured by func-tional magnetic resonance imaging(fMRI).We employed an MRI-guided finite element method to simulate the EF for the two most common tES montages(i.e.,targeting the dorsolateral prefrontal cortex and motor cortex,respectively)in two large cohorts of white and Asian participants aged 12 to 100 years.We found that the EF intensity decreased with age,particularly in individuals under 25 years of age,and was influenced by gender and ethnicity.We identified skull thickness,scalp thickness,and epidural cere-brospinal fluid thickness,as the primary anatomical factors accounting for the inter-individual EF vari-ability.Using a concurrent tES-fMRI approach,we observed a spatial consistency between the simulated EF and the brain activity changes induced by tES in the target region.Finally,we developed an open-source toolbox incorporating age-stratified head models to facilitate efficient EF calculations.These findings characterize and quantify the individual differences in tES-induced EF,offering a reference for implementing personalized neuromodulation strategies.
Transcranial electrical stimulationLifespan trajectoryElectric fieldAnatomical factorHead model
Weiwei Ma、Feixue Wang、Yangyang Yi、Yu Huang、Xinying Li、Ya'ou Liu、Yiheng Tu
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CAS Key Laboratory of Mental Health,Institute of Psychology,Chinese Academy of Sciences,Beijing 100101,China
Department of Psychology,University of Chinese Academy of Sciences,Beijing 100049,China
Research & Development,Soterix Medical Inc.,Woodbridge,NJ 07095,USA
Department of Radiology,Beijing Tiantan Hospital,Beijing 100070,China
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Transcranial electrical stimulation Lifespan trajectory Electric field Anatomical factor Head model
NETL
NSTL
万方数据
