Semiconductor Device Failure and Protection Analysis Under High-Power Microwave Action
High-power microwave produces electrocaloric effects through direct and indirect coupling,and will interfere with electronic communication equipment to varying degrees,resulting in irreversible damage to the equipment.This paper focuses on the analysis of semiconductor device failure problem under the action of high-power microwave,analyzes the changes of transistors in different columns caused by the influence of high pulses,and proposes the optimization method of transient voltage stabilizer suppressor,which is conducive to the failure protection of semiconductor devices.
high-power microwavesemiconductor devicefailure and protection
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