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铜导线一次短路熔痕显微组织再结晶过程

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采用定性模拟试验制备铜导线一次短路熔痕,用金相检验、硬度测试、扫描电镜分析等方法研究了不同受热条件下一次短路熔痕显微组织的变化规律.结果表明:铜导线一次短路熔痕形成后持续受热,显微组织存在再结晶现象;当熔痕的受热温度为800℃,保温时间为100 min时,胞状晶全部转变为柱状晶.
Microstructure recrystallization process of copper wire primary short circuit melted mark
Qualitative simulation experiments were used to prepare the primary short circuit melted marks on copper wires.The microstructure changes of the primary short circuit melted marks under different heating conditions were studied using methods such as metallographic examination,hardness testing and scanning electron microscopy analysis.The results show that the copper wire was continuously heated after the formation of primary short circuit melted mark,and the microstructure exhibited recrystallization phenomenon.When the heating temperature of the melt was 800℃and the holding time was 100 minutes,all cellular crystals transformed into columnar crystals.

copper wireprimary short circuit melted markrecrystallizationphysical evidence identificationfire investigation

陈克、张斌、邓松华、郭宇航、王轩磊

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应急管理部天津消防研究所,天津 300381

铜导线 一次短路熔痕 再结晶 物证鉴定 火灾调查

中华全国总工会职工创新补助资金项目天津市重点研发计划应急管理部天津消防研究所自有资金项目

202202000721YFFCYS000702022SJZYZJ11

2024

理化检验-物理分册
上海材料研究所

理化检验-物理分册

影响因子:0.599
ISSN:1001-4012
年,卷(期):2024.60(1)
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