Preparation of transmission electron microscopy microcolumn samples based on focused ion beam-scanning electron microscopy
By using focused ion beam-scanning electron microscopy to improve the traditional method of transmission electron microscopy sample preparation.By changing the area and effect of ion beam assisted deposition,and improving the U-shaped cut to L-shaped cut,the compressed mouse bone micro-pillars samples were successfully extracted onto a dedicated copper mesh.The extracted sample could be precisely thinned by ion beam,and the direction of collagen fibers could be observed under transmission electron microscopy.
micro-pillarfocused ion beam-scanning electron microscopytransmission electron microscopy samplePt deposition layerL-shaped cut
万方数据
维普
