首页|Oxidation of emerging organic contaminants by in-situ H2O2 fenton system
Oxidation of emerging organic contaminants by in-situ H2O2 fenton system
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The existence and risk of emerging organic contaminants(EOCs)have been under consideration and paid much effort to degrade these pollutants.Fenton system is one of the most widely used technologies to solve this problem.The original Fenton system relies on the hydroxyl radicals produced by Fe(Ⅱ)/H2O2 to oxidize the organic contaminants.However,the application of the Fenton system is limited by its low iron cycling efficiency and the high risks of hydrogen peroxide transportation and storage.The introduction of external energy(including light and electricity etc.)can effectively promote the Fe(Ⅲ)/Fe(Ⅱ)cycle and the reduction of oxygen to produce hydrogen peroxide in situ.This review introduces three in-situ Fenton systems,which are electro-Fenton,Photo-Fenton,and chemical reaction.The mechanism,influencing factors,and catalysts of these three in-situ Fenton systems in degrading EOCs are discussed systematically.This review strengthens the understanding of Fenton and in-situ Fenton systems in degradation,offering further insight into the real application of the in-situ Fenton system in the removal of EOCs.
State Environmental Protection Key Lab of Environmental Risk Assessment and Control on Chemical Processes,School of Resources & Environmental Engineering,East China University of Science and Technology,Shanghai,200237,China
Department of Applied Natural Sciences,Technische Hochschule Lübeck,Mönkhofer Weg 239,23562 Lübeck,Germany
Key Laboratory for Advanced Materials and Institute of Fine Chemicals,National Engineering Laboratory for Industrial Wastewater Treatment,School of Chemistry and Molecular Engineering,East China University of Science and Technology,130 Meilong Road,Shanghai,200237,China
国家自然科学基金国家自然科学基金Undergraduate Training Program on Innovation and Entrepreneurship上海市科委项目Shanghai Municipal Science and Technology