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基于CRITIC权重法和灰色关联分析的微芯片封装多目标参数优化

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以芯片封装为研究对象,提出了一种注塑工艺参数多目标优化方法.为解决微芯片封装注塑成型过程中出现的体积收缩和翘曲变形等缺陷问题,以体积收缩率和翘曲值为优化指标,建立5因素4水平的Taguchi正交实验设计.通过Moldflow的仿真分析,将试验结果用信噪比表示,用CRITIC权重法计算出两个优化指标的权重,利用灰色关联分析,将多目标优化转化为单目标优化问题.通过极差分析进行排序,得到5个工艺参数的影响程度,由大到小依次为模具温度、熔体温度、保压时间、保压压力、注射时间,以及得到最优工艺参数组合:模具温度为155℃,熔体温度为60℃,保压时间为5s,保压压力为55 MPa,注塑时间为0.9 s.经分析验证,优化后的体积收缩率为2.670%,翘曲值为0.026 9 mm,相较于Moldflow系统推荐的参数,最终模拟结果分别减少了8.47%和21.57%,证明此种方法能够提高塑件产品的质量,并且有效减少注塑过程中的缺陷.
Multi-objective parameter optimization of microchip package based on CRITIC weight method and grey correlation analysis
The multi-objective optimization method for injection molding process parameters was proposed taking chip packaging as the research object.In order to solve the defects such as volume shrinkage and warping deformation in the injection molding process of microchip packaging,a Taguchi orthogonal experimental design with 5 factors and 4 levels was established with volume shrinkage rate and total warping value as the optimization indexes.Through the simulation analysis of Moldflow,the test results are represented by the signal-to-noise ratio,the weights of two optimization indicators are calculated by the CRITIC weight method,the multi-objective optimization is transformed into a single objective optimization problem by using gray correlation analysis,and the influence degree of 5 process parameters is obtained by range analysis.Mold temperature>melt temperature>pressure holding time>pressure holding pressure>injection time,and the optimal combination of process parameters is obtained:mold temperature is 155 ℃,melt temperature is 60 ℃,pressure holding time is 5 s,pressure holding pressure is 55 MPa,injection time is 0.9 s.After analysis and verification,the optimized volume shrinkage rate is 2.670%,and the warpage value is 0.026 9 mm.Compared with the parameters recommended by the Moldflow system,the final simulation results are reduced by 8.47%and 21.57%respectively,which prove that this method can improve the quality of plastic parts and effectively reduce the defects in the injection molding process.

moldflowmicrochip packagingCRITIC weight methodgrey correlation analysisorthogonal test

赵玲玲、王权、范海霞、张群

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天津职业技术师范大学,机械工程学院,天津 300202

Moldflow 微芯片封装 CRITIC权重法 灰色关联分析 正交试验

2024

模具技术
上海交通大学

模具技术

CSTPCD
影响因子:0.219
ISSN:1001-4934
年,卷(期):2024.(6)