Half-sib progeny test and early selection of the 2nd generation seed orchard for Cunninghamia lanceolata
To provide technical basis for construction of high-generation seed orchard, progeny test was conducted by using half-sib progenies of the 2nd generation seed orchard of Cunninghamia lanceolata on National Forest Farm in Shaxian, Fujian province. The results showed that there were geneticdifferences among families in growth and preservation rate. And the differences were controlled by genetic factors, moderately or lower. By contrast, more genetic gain would be got if volume other than tree height and DBH was used as the selection index. Six superior families and 12 superior individuals were selected based on data of four consecutive years. During the the same period, nine poor families were selected in the 2nd generation seed orchard for thinning cut to improve the seed orchard. This study provides a meaningful technique for the construction of high-generation seed orchard.
国家科技期刊平台
NSTL
万方数据
维普
