Effect of Free Boron Content on the Compressive Properties of Hollow Glass Microspheres
In this experiment,two groups of hollow glass microspheres prepared by the same process with different pressure resistance properties were analyzed.The electrical conductivity of the precipitated liquid was tested,and the product and the precipitated liquid were tested by inductively coupled plasma emission spectrometry(ICP-OES)and X-ray photoelectron spectroscopy(XPS).The test results show that the two samples are the same in terms of composition,particle size and density,but the ICP test reflects that the free elemental boron in the precipitate of HGM2 is 8.6％higher than that of HGM1,and the XPS test reflects that the B/Si peak area of the HGM2 sample is 13％less than that of HGM1.It is shown that in the structure of the two sets of hollow glass bead samples,the more sufficiently the element boron is involved in glass formation bonding,the higher the compressive strength of the product.The precipitated content in aqueous solution can be used as the test point and evaluation index to reflect the strength performance of the product.This experiment provides a theoretical basis for improving the preparation process and developing the application process of hollow glass microbeads.
hollow glass microspheresboronpressure-resistant propertiesinvisible inorganic nonmetallic material
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