首页|硅多晶硅芯的质量因素导致金属探测器报警的研究

硅多晶硅芯的质量因素导致金属探测器报警的研究

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硅芯是生产硅多晶的重要载体材料,其质量与硅多晶产品质量息息相关.硅多晶包装流水线安装有金属探测器,硅芯触发报警,会导致生产线停工,严重影响包装效率和生产流水线正常运行.通过研究硅芯的电阻率、导电型号、体金属杂质、磁性颗粒以及单晶多晶结构等与金属探测仪报警的关系,分析硅芯报警值的重要影响因素,通过提高硅芯的内在质量,达到提升生产包装效率的目的,为降低硅芯报警提供技术支持,确保生产包装线快速稳定运行.
Research on the Alarm of the Metal Detector by the Quality of the Silicon Cores of Silicon Poly-crystalline
Silicon cores are essential carrier materials for the production of polycrystalline silicon,and it is closely related to the product quality.The packaging assembly line of polycrystalline silicon is equipped with a metal detector.The alarm triggered by silicon cores will halt the production line,severely affecting the packaging efficiency and the normal operation of the production line.This paper studies the relationship between the resistivity,conductive type,weight,bulk metal impurities,magnetic particles,single crystal and polycrystalline structure factors of silicon cores in the alarm of the metal detector,analyzes the significant factors affecting the alarm of silicon cores,and provides data support for controlling the incoming inspection quality of silicon cores.

silicon poly-crystallinesilicon coresmetal detectorresistivitybulk metal impurities

袁秋月、徐顺波、吴作木、朱敏、谢佳均、贾琳、吴麟、毛珑熹、陈小东

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四川永祥新能源有限公司,四川 乐山 614800

硅多晶 硅芯 金属探测仪 电阻率 体金属

2024

山西冶金
山西省金属学会 山西省有色金属学会

山西冶金

影响因子:0.139
ISSN:1672-1152
年,卷(期):2024.47(10)