利用数据管控法提高汽车半导体器件的可靠性
蔺鹏程 1王菲 1李建超1
作者信息
摘要
本文旨在探讨如何利用数据管控法来提高半导体器件的可靠性,尤其是汽车电子系统的可靠性.本文介绍了《基于集成电路应力测试认证的失效机理(H版)》(AEC-Q100),并探讨了如何基于该标准建立模型和算法,实现对半导体器件的在线监测和故障预警,及时发现潜在隐患,剔除可靠性较低的部分器件,以有效地提高半导体器件的可靠性;最后,用案例进行验证.
Abstract
Improving the reliability of semiconductor devices is especially important for automotive electronics.Base on"Failure Mechanism Based Stress Test Qualification for Integrated Circuits-revH"(AEC-Q100),this paper discusses how to establish a model and algorithm based on this standard to realize on-line monitoring and failure warning of semiconductor devices,find potential hidden dangers in time,and eliminate devices with lower reliability,so as to effectively improve the reliability of semiconductor devices;and finally,method validation is carried out.
关键词
数据管控/半导体器件/汽车电子/可靠性/标准Key words
Data management and control/Semiconductor devices/Automotive electronics/Reliability/Standard引用本文复制引用
出版年
2024
NETL
NSTL
万方数据