Improving the reliability of semiconductor devices is especially important for automotive electronics.Base on"Failure Mechanism Based Stress Test Qualification for Integrated Circuits-revH"(AEC-Q100),this paper discusses how to establish a model and algorithm based on this standard to realize on-line monitoring and failure warning of semiconductor devices,find potential hidden dangers in time,and eliminate devices with lower reliability,so as to effectively improve the reliability of semiconductor devices;and finally,method validation is carried out.
Data management and controlSemiconductor devicesAutomotive electronicsReliabilityStandard
NETL
NSTL
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