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单晶SiC的化学机械抛光及辅助技术的研究进展

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由于单晶碳化硅(SiC)的传统化学机械抛光(chemical mechanical polishing,CMP)技术加工效率低,故提高SiC表面质量和材料去除率成为研究热点.总结了 CMP中抛光液的主要成分,比较了 CMP辅助抛光技术对单晶SiC抛光性能和作用机理的影响,并对单晶SiC-CMP技术的未来发展进行了展望.
Research progress of chemical mechanical polishing and auxiliary technology of single crystal SiC
The traditional chemical mechanical polishing(CMP)technology for single crystal silicon carbide(SiC)faces challenges with low processing efficiency.Consequently,improving surface quality and material removal rates of SiC has emerged as a research focal point.This paper provides a summary of the main components of CMP polishing liquids,compares the effects of CMP-assisted polishing technology on the performance and mechanisms of single crystal SiC polishing,and offers prospects for the future development of CMP for single crystal SiC.

silicon carbide(SiC)chemical mechanical polishing(CMP)CMP assisted technologypolishing rate

张佩嘉、雷红

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上海大学理学院,上海 200444

碳化硅 化学机械抛光 CMP辅助技术 抛光速率

国家自然科学基金

51975343

2024

上海大学学报(自然科学版)
上海大学

上海大学学报(自然科学版)

CSTPCD北大核心
影响因子:0.579
ISSN:1007-2861
年,卷(期):2024.30(2)
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