Design of an experimental platform for surface contour measurement based on a portable roughness meter
[Objective]To ensure precise machining and surface accuracy of complex surfaces,it is crucial to accurately measure and evaluate surface contours.Traditional instruments such as white light interferometers,ultra-depth-of-field microscopes,and surface profilometers are often expensive and bulky,requiring researchers to write custom programs for contour analysis.This paper addresses these issues by designing an experimental platform based on a portable roughness meter for surface profile data acquisition coupled with software to analyze the data.[Methods]The designed experimental platform for surface contour measurement consists of a three-axis moving device,a fixture,a contour data acquisition device(roughness meter)and a computer.To ensure stable data collection,a fixture accommodating workpieces of different shapes and sizes is designed,and a three-axis moving device is built using three sets of linear slide modules to adjust the workpiece and the roughness meter positions during measurement.The collected surface contour data is exported as an Excel file.Using the Gaussian-weighted moving average method and a contour correction model,the software(developed in MATLAB's App Designer)facilitates data interception,smoothing,correction of surface contour data,and calculations of geometrical parameters like distances between points and coordinates of the highest/lowest points.The accuracy of surface contour data collected,processed,and analyzed by the test platform was verified through comparative experiments.First,the heights of rectangular microstructures measured by the platform were compared with those obtained from a metallurgical microscope.Additionally,the cross-section profiles of polished spots detected on the platform were compared with measurements from a Taylor Hobson profiler in both the x and y directions.Ultimately,the relative errors between the platform's results and those from other instruments were calculated.[Results]The experimental results showed that ① when measuring rectangular microstructures,the experimental platform's results were almost identical to those obtained with a metallurgical microscope for a height of 100 μm.For a height of 200 μm,the relative error was the largest but still maintained within 5％in both cases.② The relative errors for the cross-section areas of polished spots measured by the platform and a Taylor Horbson profiler were found to be 2.23％in the X direction and 1.54％in the y direction,respectively.[Conclusions]The designed experimental platform for surface contour measurement effectively collects and analyzes contour data of complex surfaces within 0.3-16 mm horizontally and 400 μm vertically(-200 μm to+200 μm).It is suitable for measuring microstructures,aspherical surfaces,and other surface types.Comparative experiments prove that the platform provides relatively accurate contour and geometrical data.Furthermore,its low cost and compact size make it ideal for undergraduate and graduate teaching experiments.
surface contourroughness meterexperimental device improvementdata processing and analysis
万方数据
维普
