Emissivity of coating surface is one of the key parameters of aircraft performance.Due to the limitations of existing measurement methods,this paper establishes a mathematical model for non-contact measurement of total hemispherical emissivity,and develops a non-contact measurement device for coating emissivity which enables in-situ,real-time measurements,by means of an infrared camera.Some key factors that affect measurement results are discussed.After the developed non-contact measurement setup was constructed,it was utilized to calibrate and measure a variety of coating specimens.The measurement results were compared with the existing device,and it was found that the maximum relative error percentage of total hemispherical emissivity was less than 4.1％,which verified the validity of the measurement method.
维普
万方数据