Effect of residual stress on natural frequency of thin-walled component
For precision components in synchrotron radiation light source,the wire EDM often induces residual stresses on the component surfaces,leading to deviations from the expected vibration characteristics in the design,which can affect the stability of the electron beam.This paper measured the natural frequency of a flexure thin-walled connection specimen,and analyzed the residual stress at the flexure hinges using both the digital image correlation method and the notching method.Furthermore,the finite element method was employed to probe into the effect of residual stress on the natural frequency of the flexure hinge.The investigation helps to explore the deviation between the measured flexure hinge and the designed one and offers a design foundation for understanding the vibration characteristics of the thin-walled components.